Wafer Sorting / EFEM

IL C3600

The IL C3600 is far more than a high-performance wafer sorting system. Thanks to its flexible system concept, it is also ideally suited as an EFEM (Equipment Front End Module) for automated process, metrology, and inspection applications.

Red light scanning a wafer in the IL C3600
Modularity

One platform – numerous applications

The IL C3600’s key strength lies in its modular, adaptable architecture. Depending on customer requirements, the system can be equipped with different handling and functional modules and tailored to specific metrology and inspection tasks.

This creates a flexible platform for applications where automated wafer handling, metrology, and inspection must be combined. Customer-specific integrations and connectivity to external systems are, of course, also possible.

Thickness measurement
AOI
Manual optical inspection
Edge scan
Frontside or backside scan
XRD
Reliability

Precise handling meets intelligent integration

For processing 300 mm wafers, the IL C3600 features a single- or dual-arm robot and can be equipped with up to five automatic FOUP loadports. The system operates in an ISO 3 Mini-Environment and supports automated loading via AGV, PGV, and OHT.

This makes the IL C3600 an ideal basis for modern production and test environments—whether as a sorting system, as an EFEM, or as an integrated handling platform for metrology and inspection solutions.

Operation at the screen in the inspection chamber of the IL C3600
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Documents for the IL C3600

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  • Product catalogPDF · 6.0 MB
  • Technical data sheet IL C3600PDF · 237.6 KB

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